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Zarathust | 8 years ago

You have a bunch of nice images. Are those taken with "standard" microscopes?

Also you mentioned a background in metrology. How do you inspect something a few atoms thick?

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avs733|8 years ago

The device level images are a mix of Scanning Electron Microscope (SEM) and visual microscope images.

A bunch of different ways. Depends on the material being measured but measuring sheet resistance (effectively, you can back calculate the thickness by measuring the resistance of a square of known size) and light scattering off the surface are the most common.